SEM Image Analysis for Roughness Assessment of Implant Materials View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2005

AUTHORS

Wlodzimierz Klonowski , Elzbieta Olejarczyk , Robert Stepien

ABSTRACT

We propose a new very simple method to determine roughness of a surface of an implant material from its scanning electron microscopy (SEM) image. For this purpose we have combined a preprocessing method that has been used in histopathology with fractal method used in nonlinear time series analysis. In the pre-processing step the image is transformed into 1-D signals (‘landscapes’) that are subsequently analyzed. Our method draws from multiple disciplines and may find multidisciplinary applications. More... »

PAGES

553-560

References to SciGraph publications

Book

TITLE

Computer Recognition Systems

ISBN

978-3-540-25054-8
978-3-540-32390-7

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/3-540-32390-2_65

DOI

http://dx.doi.org/10.1007/3-540-32390-2_65

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1009902855


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