David C Joy


Ontology type: schema:Person     


Person Info

NAME

David C

SURNAME

Joy

Publications in SciGraph latest 50 shown

  • 2018-12 Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo model in SCIENTIFIC REPORTS
  • 2018 High Resolution Imaging in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 ImageJ and Fiji in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Variable Pressure Scanning Electron Microscopy (VPSEM) in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Electron Beam—Specimen Interactions: Interaction Volume in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM) in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Characterizing Crystalline Materials in the SEM in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Low Beam Energy SEM in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Compositional Mapping in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Qualitative Elemental Analysis by Energy Dispersive X-Ray Spectrometry in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Ion Beam Microscopy in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Energy Dispersive X-Ray Microanalysis Checklist in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Trace Analysis by SEM/EDS in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 X-Rays in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 The Visibility of Features in SEM Images in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 SEM Case Studies in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Scanning Electron Microscope (SEM) Instrumentation in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Quantitative Analysis: From k-ratio to Composition in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 X-Ray Microanalysis Case Studies in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 SEM Imaging Checklist in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Quantitative Analysis: The SEM/EDS Elemental Microanalysis k-ratio Procedure for Bulk Specimens, Step-by-Step in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Low Beam Energy X-Ray Microanalysis in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Backscattered Electrons in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Image Defects in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 SEM Image Interpretation in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Cathodoluminescence in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Focused Ion Beam Applications in the SEM Laboratory in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Image Formation in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 Secondary Electrons in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2018 DTSA-II EDS Software in SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
  • 2016-09 Nanoforging Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams in SCIENTIFIC REPORTS
  • 2015-12 Maskless Lithography and in situ Visualization of Conductivity of Graphene using Helium Ion Microscopy in SCIENTIFIC REPORTS
  • 2012-04 SEM for the 21st Century: Scanning Ion Microscopy in METALLOGRAPHY, MICROSTRUCTURE, AND ANALYSIS
  • 2006 Fundamentals of Scanning Electron Microscopy (SEM) in SCANNING MICROSCOPY FOR NANOTECHNOLOGY
  • 2004-04 Microcalorimeter Detectors and Low Voltage SEM Microanalysis in MICROCHIMICA ACTA
  • 2003 Scanning Electron Microscopy and X-ray Microanalysis, Third Edition in NONE
  • 2002-05 Improving Matrix Corrections in MICROCHIMICA ACTA
  • 2000-03 Damage mechanisms and fiber orientation effects on the load-bearing capabilities of a NEXTEL/BLACKGLAS low-cost ceramic composite in METALLURGICAL AND MATERIALS TRANSACTIONS A
  • 2000-03 Damage mechanisms and fiber orientation effects on the load-bearing capabilities of a NEXTEL/BLACKGLAS low-cost ceramic composite in METALLURGICAL AND MATERIALS TRANSACTIONS A
  • 1999 Off-Axis Stem Holography in INTRODUCTION TO ELECTRON HOLOGRAPHY
  • 1999 Quantitative Electron Holography in INTRODUCTION TO ELECTRON HOLOGRAPHY
  • 1999 Optical Characteristics of an Holography Electron Microscope in INTRODUCTION TO ELECTRON HOLOGRAPHY
  • 1999 Applications of Electron Holography in INTRODUCTION TO ELECTRON HOLOGRAPHY
  • 1999 Electron Holography Using Diffracted Electron Beams (DBH) in INTRODUCTION TO ELECTRON HOLOGRAPHY
  • 1999 Focus Variation Electron Holography in INTRODUCTION TO ELECTRON HOLOGRAPHY
  • 1999 The Reconstruction of Off-Axis Electron Holograms in INTRODUCTION TO ELECTRON HOLOGRAPHY
  • 1999 A Plus or Minus Sign in the Fourier Transform? in INTRODUCTION TO ELECTRON HOLOGRAPHY
  • 1999 Electron Holography at Low Energy in INTRODUCTION TO ELECTRON HOLOGRAPHY
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