Sergei S Rouvimov


Ontology type: schema:Person     


Person Info

NAME

Sergei S

SURNAME

Rouvimov

Publications in SciGraph latest 50 shown

  • 2020-01-03 Topological Insulator Bi2Se3 Films on Silicon Substrates in JOURNAL OF ELECTRONIC MATERIALS
  • 2018-09 Formation of Amorphous Structures and Their Crystallization in the Cu–Ti System by High-Energy Ball Milling in RUSSIAN JOURNAL OF NON-FERROUS METALS
  • 2018-03-08 GaN/NbN epitaxial semiconductor/superconductor heterostructures in NATURE
  • 2018-02 Crystallization of a Mechanically Activated CuTi Alloy in DOKLADY PHYSICS
  • 2017-07-25 Lasing in microdisks with an active region based on lattice-matched InP/AlInAs nanostructures in TECHNICAL PHYSICS
  • 2017-03-16 Optical properties of hybrid quantum-well–dots nanostructures grown by MOCVD in SEMICONDUCTORS
  • 2016-11-08 AlGaN Nanostructures with Extremely High Room-Temperature Internal Quantum Efficiency of Emission Below 300 nm in JOURNAL OF ELECTRONIC MATERIALS
  • 2016-09-16 Optical properties of hybrid quantum-confined structures with high absorbance in SEMICONDUCTORS
  • 2016-03-30 Layered transition metal dichalcogenides: promising near-lattice-matched substrates for GaN growth in SCIENTIFIC REPORTS
  • 2016-01-06 Controllable growth of layered selenide and telluride heterostructures and superlattices using molecular beam epitaxy in JOURNAL OF MATERIALS RESEARCH
  • 2015-08-02 Effect of the bimodality of a QD array on the optical properties and threshold characteristics of QD lasers in SEMICONDUCTORS
  • 2015-03-13 Defect engineering in AlGaN-based UV optoelectronic heterostructures grown on c-Al2O3 by plasma-assisted molecular beam epitaxy in MRS ADVANCES
  • 2013-09-04 W and two-dimensional WO3/W nanocrystals produced by controlled self-sustaining reduction of sodium tungstate in JOURNAL OF MATERIALS RESEARCH
  • 2012-02-23 New Layered Intergrowths in the Sn-Mo-Se System in JOURNAL OF ELECTRONIC MATERIALS
  • 2011-06-17 Automated Crystallite Orientation and Phase Mapping in a Transmission Electron Microscope in MRS ADVANCES
  • 2010-02 X-ray diffraction study of silicon single crystals highly doped with boron in JOURNAL OF SURFACE INVESTIGATION: X-RAY, SYNCHROTRON AND NEUTRON TECHNIQUES
  • 2009 Structural Fingerprinting of Nanocrystals: Advantages of Precession Electron Diffraction, Automated Crystallite Orientation and Phase Maps in MRS ADVANCES
  • 2002 Application Of Room-Temperature Photoluminescence For Characterizing Thermally Processed Cz Silicon Wafers in MRS ADVANCES
  • 1998-05 Effects of GaAs-spacer strain on vertical ordering of stacked InAs quantum dots in a GaAs matrix in JOURNAL OF ELECTRONIC MATERIALS
  • 1997 Chemical and Structural Analysis of Nitridated Sapphire in MRS ADVANCES
  • 1997 Comparative Analysis of Strain and Stress in MBE and MOCVD grown GaN thin films on sapphire in MRS ADVANCES
  • 1995 Structural Processes in Gold-Based Metallization During the Formation of Ohmic Contacts to GaSb in MRS ADVANCES
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