R N Kyutt


Ontology type: schema:Person     


Person Info

NAME

R N

SURNAME

Kyutt

Publications in SciGraph latest 50 shown

  • 2018-09 Defect Structure of GaAs Layers Implanted with Nitrogen Ions in TECHNICAL PHYSICS LETTERS
  • 2018-06 Reciprocal-Space Maps of X-Ray Diffraction Intensity Distribution and Their Relation to the Dislocation Structure of Epitaxial Layers in TECHNICAL PHYSICS LETTERS
  • 2018-04 Intensity Distribution of the Three-Wave Diffraction from Dislocation Epitaxial Layers in the Reciprocal Space in PHYSICS OF THE SOLID STATE
  • 2017-10 On magnetism of nickel clusters in nanoporous carbon in PHYSICS OF THE SOLID STATE
  • 2016-06 On the role of secondary extinction in the measurement of the integrated intensity of X-ray diffraction peaks and in the determination of the thickness of damaged epitaxial layers in PHYSICS OF THE SOLID STATE
  • 2014-12 X-ray diffraction determination of the degree of ordering of a solid solution in epitaxial AlGaN layers in PHYSICS OF THE SOLID STATE
  • 2014-10 The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction in TECHNICAL PHYSICS LETTERS
  • 2013-12 X-ray diffraction study of short-period AlN/GaN superlattices in CRYSTALLOGRAPHY REPORTS
  • 2013-12 Defects and stresses in MBE-grown GaN and Al0.3Ga0.7N layers doped by silicon using silane in CRYSTALLOGRAPHY REPORTS
  • 2013-07 Electrical and galvanomagnetic properties of nanoporous carbon samples impregnated with bromine in PHYSICS OF THE SOLID STATE
  • 2012-01 Structural characterization of AlGaN/GaN superlattices by three-beam X-ray diffraction in TECHNICAL PHYSICS LETTERS
  • 2011-09 Photoluminescence in silicon implanted with silicon ions at amorphizing doses in SEMICONDUCTORS
  • 2011-08 Cluster structure of nanoporous carbon produced from silicon carbide in PHYSICS OF THE SOLID STATE
  • 2011-05 Three-wave diffraction in damaged epitaxial layers with a wurtzite structure in TECHNICAL PHYSICS
  • 2011-04 Effect of epilayer microstructure on shape of X-Ray diffraction peaks in TECHNICAL PHYSICS LETTERS
  • 2010-08 Studying defect structure of GaN epilayers by means of three-beam X-ray diffraction analysis in TECHNICAL PHYSICS LETTERS
  • 2010-04 X-ray diffraction diagnostics methods as applied to highly doped semiconductor single crystals in TECHNICAL PHYSICS
  • 2010-02 X-ray diffraction study of silicon single crystals highly doped with boron in JOURNAL OF SURFACE INVESTIGATION: X-RAY, SYNCHROTRON AND NEUTRON TECHNIQUES
  • 2010-02 Microstructure and strain of ZnO molecular-beam epitaxial layers on sapphire in SEMICONDUCTORS
  • 2009-11 Interlayer relaxation in group-III-nitride-based heterostructures according to X-Ray diffraction data in TECHNICAL PHYSICS LETTERS
  • 2009-10 Magnetism of palladium clusters in nanoporous carbon in JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS
  • 2009-09 Anisotropy of elastic strains and specific features of the defect structure of a-plane GaN epitaxial films grown on r-plane sapphire in PHYSICS OF THE SOLID STATE
  • 2009-08 Optical and X-ray diffraction studies of multilayer structures based on InGaN/GaN solid solutions in PHYSICS OF THE SOLID STATE
  • 2009-03 Palladium clusters in nanoporous carbon samples: Structural properties in PHYSICS OF THE SOLID STATE
  • 2007-03 Clusters of sulfur and selenium in nanoporous carbon in PHYSICS OF THE SOLID STATE
  • 2006-12 Diagnostics of highly doped czochralski-grown silicon crystals in TECHNICAL PHYSICS LETTERS
  • 2006-09 Structural state of III nitride layers implanted with erbium ions in PHYSICS OF THE SOLID STATE
  • 2006-08 The defect structure of AlGaN/GaN superlattices grown on sapphire by the MOCVD method in PHYSICS OF THE SOLID STATE
  • 2004-02 Deformation of AlGaN/GaN superlattice layers according to x-ray diffraction data in PHYSICS OF THE SOLID STATE
  • 2003-07 X-raying studies of the nanoporous carbon structure produced from carbide materials in SEMICONDUCTORS
  • 2002-10 Small-angle x-ray scattering in a carbon-sulfur nanocomposite produced from bulk nanoporous carbon in PHYSICS OF THE SOLID STATE
  • 2002-07 GaAs in GaSb: Strained nanostructures for mid-infrared optoelectronics in SEMICONDUCTORS
  • 2000-12 X-ray measurement of a microdistortion tensor and its application in an analysis of the dislocation structure of thick GaN layers obtained by hydrochloride gaseous-phase epitaxy in PHYSICS OF THE SOLID STATE
  • 2000-11 Internal microstrain and distribution of composition and cathodoluminescence over lapped AlxGa1−xN epilayers on sapphire in SEMICONDUCTORS
  • 2000-06 On fractal nature of the structure of nanoporous carbon obtained from carbides in PHYSICS OF THE SOLID STATE
  • 1999-08 Structural study of nanoporous carbon produced from polycrystalline carbide materials: Small-angle x-ray scattering in PHYSICS OF THE SOLID STATE
  • 1999-05 Structural studies of nanoporous carbon produced from silicon carbide in PHYSICS OF THE SOLID STATE
  • 1999-01 Structural perfection of GaN epitaxial layers according to x-ray diffraction measurements in PHYSICS OF THE SOLID STATE
  • 1998-09 Low-temperature photoluminescence of heavy-ion-implanted InGaP solid solutions in TECHNICAL PHYSICS LETTERS
  • 1998-08 Comparative analysis of Bragg and Laue diffraction from CdF2-CaF2 superlattices on Si(111) in PHYSICS OF THE SOLID STATE
  • 1997-07 Measurement of the differential and integral distribution of diffuse x-ray scattering intensity from defects in thin strained layers in PHYSICS OF THE SOLID STATE
  • 1997-06 Properties of strontium titanate in the SrTiO3/CeO2/Al2O3 multilayered structure in PHYSICS OF THE SOLID STATE
  • 1997-05 X-ray diffraction studies of silicon implanted with high-energy erbium ions in PHYSICS OF THE SOLID STATE
  • 1997-02 Application of X-ray diffraction in Laue geometry to imperfect near-surface layers in IL NUOVO CIMENTO D
  • 1992 Structural Defects in Epitaxial Layers SiC-3C/Si Grown by CVD in AMORPHOUS AND CRYSTALLINE SILICON CARBIDE IV
  • Affiliations

  • Ioffe Institute (current)
  • JSON-LD is the canonical representation for SciGraph data.

    TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

    [
      {
        "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
        "affiliation": [
          {
            "affiliation": {
              "id": "https://www.grid.ac/institutes/grid.423485.c", 
              "type": "Organization"
            }, 
            "isCurrent": true, 
            "type": "OrganizationRole"
          }
        ], 
        "familyName": "Kyutt", 
        "givenName": "R N", 
        "id": "sg:person.011264372143.83", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011264372143.83"
        ], 
        "sdDataset": "persons", 
        "sdDatePublished": "2019-03-07T14:01", 
        "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
        "sdPublisher": {
          "name": "Springer Nature - SN SciGraph project", 
          "type": "Organization"
        }, 
        "sdSource": "s3://com-uberresearch-data-dimensions-researchers-20181010/20181011/dim_researchers/base/researchers_1781.json", 
        "type": "Person"
      }
    ]
     

    Download the RDF metadata as:  json-ld nt turtle xml License info

    HOW TO GET THIS DATA PROGRAMMATICALLY:

    JSON-LD is a popular format for linked data which is fully compatible with JSON.

    curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/person.011264372143.83'

    N-Triples is a line-based linked data format ideal for batch operations.

    curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/person.011264372143.83'

    Turtle is a human-readable linked data format.

    curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/person.011264372143.83'

    RDF/XML is a standard XML format for linked data.

    curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/person.011264372143.83'


     




    Preview window. Press ESC to close (or click here)


    ...