Andreas Markwitz


Ontology type: schema:Person     


Person Info

NAME

Andreas

SURNAME

Markwitz

Publications in SciGraph latest 50 shown

  • 2013-08 Determination of chemical elements in airborne particulate matter collected at Lembang, Indonesia by particle induced X-ray emission in JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY
  • 2013-08 Characterization of airborne particulate matter collected at Jakarta roadside of an arterial road in JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY
  • 2012-07 Size-fractionated airborne particulate matter characterization of a residential area near Islamabad airport by IBA methods in JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY
  • 2012-07 Air quality study of Islamabad: preliminary results in JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY
  • 2012-02 Effect of annealing on the structural, electrical and magnetic properties of Gd-implanted ZnO thin films in JOURNAL OF MATERIALS SCIENCE
  • 2012-02 Evolution of the structure and magneto-optical properties of ion beam synthesized iron nanoclusters in JOURNAL OF MATERIALS SCIENCE
  • 2010-09 The Effect of Substrate Surface Oxides on the Bonding of NiCr Alloy Particles HVAF Thermally Sprayed onto Aluminum Substrates in JOURNAL OF THERMAL SPRAY TECHNOLOGY
  • 2010-08 Field Emission from Silicon Implanted with Carbon and Nitrogen Followed by Electron Beam Annealing in JOURNAL OF ELECTRONIC MATERIALS
  • 2007-04 Ion Beam Analysis of Amorphous and Nanocrystalline Group III-V Nitride and ZnO Thin Films in JOURNAL OF ELECTRONIC MATERIALS
  • 2006-12 Effect of substrate hardness on splat morphology in high-velocity thermal spray coatings in JOURNAL OF THERMAL SPRAY TECHNOLOGY
  • 2005-12 Evidence of mechanical interlocking of NiCr particles thermally sprayed onto Al substrates in JOURNAL OF THERMAL SPRAY TECHNOLOGY
  • 2004-07 Optimization of Non-Fluorine Sol-Gel Derived YBCO Thin Films in JOURNAL OF ELECTROCERAMICS
  • 2001-09 Influence of the Native Oxide Layer on the Silicon Surface During Initial Stages of Nitridation in MICROCHIMICA ACTA
  • 1997-05 Characterization of the interdiffusion in Au-Al layers by RBS in JOURNAL OF ANALYTICAL CHEMISTRY
  • 1997-03 Molecular ion implantation in silicon in MICROCHIMICA ACTA
  • 1997-03 Nitrogen depth distribution, interface and structure analysis of SiNx layers produced by low-energy ion implantation in MICROCHIMICA ACTA
  • 1995-10 Combined NRA, channeling-RBS and FTIR ellipsometry analyses for the determination of the interface and bonding state of thin SiOx and SiNxOy layers in ANALYTICAL AND BIOANALYTICAL CHEMISTRY
  • 1995-10 Characterisation of 13C implantations in silicon by NRA [13C(p,γ)14N] and RBS in JOURNAL OF ANALYTICAL CHEMISTRY
  • 1995-01 Combined NRA, channeling-RBS and FTIR ellipsometry analyses for the determination of the interface and bonding state of thin SiOx and SiNxOy layers in JOURNAL OF ANALYTICAL CHEMISTRY
  • 1995-01 Characterisation of 13C implantations in silicon by NRA [13C(p,γ)14N] and RBS in JOURNAL OF ANALYTICAL CHEMISTRY
  • 1995-01 Surface-near analyses of ultra thin silicon nitride layers by NRA, channeling RBS, FT IR ellipsometry and AFM in JOURNAL OF ANALYTICAL CHEMISTRY
  • 1994-10 Chemical bonding and interface analysis of ultrathin silicon-nitride layers produced by ion implantation and Electron Beam Rapid Thermal Annealing (EB-RTA) in APPLIED PHYSICS A
  • 1993-01 Characterisation of thin sputtered silicon nitride films by NRA, ERDA, RBS and SEM in JOURNAL OF ANALYTICAL CHEMISTRY
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