High-Resolution Ion Trap Mass Spectrometer


Ontology type: sgo:Patent     


Patent Info

DATE

N/A

AUTHORS

REMES, PHILIP M. , SCHWARTZ, JAE C.

ABSTRACT

Techniques can increase the resolution and accuracy of mass spectra obtained using ion traps through the use of the actual shape of the ion trap peaks, which is a series of smaller ion ejection events. The peak shapes are identified as changing over a common period of the trapping signal and the excitation signal, at which point the peak shapes repeat. Peak shapes can be characterized over the common period to create N basis functions, each for a different fractional mass for a given scan rate. The N basis functions over the common period can be duplicated (e.g., shifted by the common period) to obtain a set of mass functions that characterize fractional masses over the full scan range. The mass spectrum can be obtained by fitting the set of mass functions to the measured data to obtain a best fit contribution of each mass function to the measured data. More... »

Related SciGraph Publications

  • 2002-06. A two-dimensional quadrupole ion trap mass spectrometer in JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
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