Methods and apparatus for calibrating ion trap mass spectrometers


Ontology type: sgo:Patent     


Patent Info

DATE

N/A

AUTHORS

SCHWARTZ, JAE C. , REMES, PHILIP M.

ABSTRACT

An exemplary method of calibrating an ion trap having electrodes to which main RF trapping and resonant ejection voltages are applied comprises: identifying, for each of a plurality of ion types having different respective mass-to-charge ratios, an optimum resonant ejection voltage amplitude at which a mass peak quality is optimized when the ion trap mass analyzer is operated at a selected scan rate; determining a best-fit function of the form Vreseject = mc (a + bm), where Vreseject and m represent resonant ejection voltage amplitude and mass-to-charge ratio and a, b and c are constants; identifying, for each of a plurality of ion types a respective RF voltage amplitude at which ions of each respective ion type are ejected from the ion trap using resonant ejection voltage calculated according to best-fit function; determining a second best-fit function relating the identified trapping voltage amplitudes to mass-to-charge ratio; and storing information relating to the best-fit functions. More... »

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