Journal of Electronic Testing View Homepage


Ontology type: schema:Periodical     


Journal Info

START YEAR

N/A

PUBLISHER

Springer US

LANGUAGE

en

HOMEPAGE

http://link.springer.com/journal/10836

Recent publications latest 20 shown

  • 2019-04-12 Low Delay 3-Bit Burst Error Correction Codes
  • 2019-04-12 Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits
  • 2019-03-27 An Integrated on-Silicon Verification Method for FPGA Overlays
  • 2019-03-26 Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects
  • 2019-03-26 Low-Cost Strategy for Bus Propagation Delay Reduction
  • 2019-03-23 Editorial
  • 2019-03-19 Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers
  • 2019-03-19 Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110 MHz)
  • 2019-03-18 Test Technology Newsletter
  • 2019-03-16 Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems
  • 2019-03-05 A Unified Approach to Detect and Distinguish Hardware Trojans and Faults in SRAM-based FPGAs
  • 2019-02-27 Testing of Current Carrying Capacity of Conducting Tracks in High Power Flexible Printed Circuit Boards
  • 2019-02 An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects
  • 2019-02 Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops
  • 2019-02 Test Technology Newsletter
  • 2019-02 Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies
  • 2019-02 Metric-Driven Verification Methodology with Regression Management
  • 2019-02 New Editors – 2019
  • 2019-02 Editorial
  • 2019-02 2018JETTAReviewers
  • JSON-LD is the canonical representation for SciGraph data.

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    [
      {
        "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
        "about": [
          {
            "id": "http://scigraph.springernature.com/ontologies/product-market-codes/T24068", 
            "inDefinedTermSet": "http://scigraph.springernature.com/ontologies/product-market-codes/", 
            "name": "Circuits and Systems", 
            "type": "DefinedTerm"
          }, 
          {
            "id": "http://scigraph.springernature.com/ontologies/product-market-codes/T24000", 
            "inDefinedTermSet": "http://scigraph.springernature.com/ontologies/product-market-codes/", 
            "name": "Electrical Engineering", 
            "type": "DefinedTerm"
          }, 
          {
            "id": "http://scigraph.springernature.com/ontologies/product-market-codes/I23044", 
            "inDefinedTermSet": "http://scigraph.springernature.com/ontologies/product-market-codes/", 
            "name": "Computer-Aided Engineering (CAD, CAE) and Design", 
            "type": "DefinedTerm"
          }
        ], 
        "alternateName": "Theory and Applications", 
        "contentRating": [
          {
            "author": "snip", 
            "ratingValue": "0.55", 
            "type": "Rating"
          }, 
          {
            "author": "sjr", 
            "ratingValue": "0.191", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2017", 
            "ratingValue": "0.554", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2016", 
            "ratingValue": "0.647", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2015", 
            "ratingValue": "0.361", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2014", 
            "ratingValue": "0.519", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2013", 
            "ratingValue": "0.429", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2009", 
            "ratingValue": "0.473", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2012", 
            "ratingValue": "0.454", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2011", 
            "ratingValue": "0.468", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2010", 
            "ratingValue": "0.500", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2009", 
            "ratingValue": "0.473", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2007", 
            "ratingValue": "0.238", 
            "type": "Rating"
          }, 
          {
            "author": "impact_factor_wos", 
            "dateCreated": "2008", 
            "ratingValue": "0.410", 
            "type": "Rating"
          }
        ], 
        "description": "

    The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

    \n

    A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

    \n

    In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

    ", "editor": [ { "familyName": "Agrawal", "givenName": "Vishwani", "type": "Person" } ], "id": "sg:journal.1136396", "inLanguage": [ "en" ], "isAccessibleForFree": false, "issn": [ "0923-8174", "1573-0727" ], "license": "Hybrid (Open Choice)", "name": "Journal of Electronic Testing", "productId": [ { "name": "scopus_id", "type": "PropertyValue", "value": [ "18040" ] }, { "name": "nsd_ids_id", "type": "PropertyValue", "value": [ "442821" ] }, { "name": "wos_id", "type": "PropertyValue", "value": [ "0923-8174/JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS" ] }, { "name": "springer_id", "type": "PropertyValue", "value": [ "10836" ] }, { "name": "dimensions_id", "type": "PropertyValue", "value": [ "136396" ] } ], "publisher": { "name": "Springer US", "type": "Organization" }, "publisherImprint": "Springer", "sameAs": [ "https://app.dimensions.ai/discover/publication?and_facet_source_title=jour.1136396" ], "sdDataset": "journals", "sdDatePublished": "2019-03-18T11:05", "sdLicense": "https://scigraph.springernature.com/explorer/license/", "sdPublisher": { "name": "Springer Nature - SN SciGraph project", "type": "Organization" }, "sdSource": "file:///home/ubuntu/piotr/scigraph_export/journals_20190313_sn_only.jsonl", "type": "Periodical", "url": "http://link.springer.com/journal/10836" } ]
     

    Download the RDF metadata as:  json-ld nt turtle xml License info

    HOW TO GET THIS DATA PROGRAMMATICALLY:

    JSON-LD is a popular format for linked data which is fully compatible with JSON.

    curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/journal.1136396'

    N-Triples is a line-based linked data format ideal for batch operations.

    curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/journal.1136396'

    Turtle is a human-readable linked data format.

    curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/journal.1136396'

    RDF/XML is a standard XML format for linked data.

    curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/journal.1136396'


     

    This table displays all metadata directly associated to this object as RDF triples.

    156 TRIPLES      21 PREDICATES      42 URIs      35 LITERALS      22 BLANK NODES

    Subject Predicate Object
    1 sg:journal.1136396 schema:about sg:ontologies/product-market-codes/I23044
    2 sg:ontologies/product-market-codes/T24000
    3 sg:ontologies/product-market-codes/T24068
    4 schema:alternateName Theory and Applications
    5 schema:contentRating N17e92483024f452a8525733d2f9d4dd4
    6 N20fe5a50bb2c417fa9e746549c0d2ae9
    7 N273f0d4b1abc4791a091d36f21050657
    8 N2a32e38ab40446b883125b005b9f3991
    9 N30c88bcbbf394240aeabdef13df0aa59
    10 N4920494fe7544d9da3e5b6c245d18ce9
    11 N510c21437adb4216a1b8745484296bc7
    12 N6c24c00c39194c7dacb720a7f53cddef
    13 N83dd082146774ae1a27264f35e2faef8
    14 N9957140dba9e457daaf5ef1607b35757
    15 Nad23456f04ac418397d7724c833b394f
    16 Nbf2b6fd520e74f31b3e31985093511be
    17 Ne050523e626e45c295869c486b34439f
    18 Ne84ca50aed14433396bc27e37487f874
    19 schema:description <P>The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.</P> <P>A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.</P> <P>In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.</P>
    20 schema:editor Nacf45bea96f742219bec7be54d2e147b
    21 schema:inLanguage en
    22 schema:isAccessibleForFree false
    23 schema:issn 0923-8174
    24 1573-0727
    25 schema:license Hybrid (Open Choice)
    26 schema:name Journal of Electronic Testing
    27 schema:productId N1e76f2bae9604256ab06f2b7b375b032
    28 N2c1d3303260c4c4fb5623e1e28d89751
    29 N6d388b58b1ff46efb19285504fb7ccea
    30 N9440be0beeb6434fbc4941d93ca03b4e
    31 Nf1440821a6e34027b32f9ef1a27a73c9
    32 schema:publisher Nc340a45f5f3445ddbcd461fd0664859e
    33 schema:publisherImprint Springer
    34 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_source_title=jour.1136396
    35 schema:sdDatePublished 2019-03-18T11:05
    36 schema:sdLicense https://scigraph.springernature.com/explorer/license/
    37 schema:sdPublisher N993e7005dffe448998b30694e52d28b7
    38 schema:url http://link.springer.com/journal/10836
    39 sgo:license sg:explorer/license/
    40 sgo:sdDataset journals
    41 rdf:type schema:Periodical
    42 N008058a55af5496d822663983706e718 rdf:first impact_factor_wos
    43 rdf:rest rdf:nil
    44 N12fe8b4192fe42debb254d2045af3050 rdf:first impact_factor_wos
    45 rdf:rest rdf:nil
    46 N17e92483024f452a8525733d2f9d4dd4 schema:author Naff027df7d6c403ba0ad2922cdf7218e
    47 schema:ratingValue 0.55
    48 rdf:type schema:Rating
    49 N1e76f2bae9604256ab06f2b7b375b032 schema:name dimensions_id
    50 schema:value 136396
    51 rdf:type schema:PropertyValue
    52 N20fe5a50bb2c417fa9e746549c0d2ae9 schema:author Nb4eafa703e5443dda3da808282e4367d
    53 schema:dateCreated 2008
    54 schema:ratingValue 0.410
    55 rdf:type schema:Rating
    56 N273f0d4b1abc4791a091d36f21050657 schema:author N807f9a940611475687a2d25bf9e54f42
    57 schema:dateCreated 2016
    58 schema:ratingValue 0.647
    59 rdf:type schema:Rating
    60 N2a32e38ab40446b883125b005b9f3991 schema:author N008058a55af5496d822663983706e718
    61 schema:dateCreated 2014
    62 schema:ratingValue 0.519
    63 rdf:type schema:Rating
    64 N2b25e6d396db4d5280deb541da8e580f rdf:first sjr
    65 rdf:rest rdf:nil
    66 N2c1d3303260c4c4fb5623e1e28d89751 schema:name wos_id
    67 schema:value 0923-8174/JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
    68 rdf:type schema:PropertyValue
    69 N30c88bcbbf394240aeabdef13df0aa59 schema:author Ne35ff696d672444d9546c6ad19bdef93
    70 schema:dateCreated 2013
    71 schema:ratingValue 0.429
    72 rdf:type schema:Rating
    73 N36be478d54bd4257b1543b2615433b0b rdf:first impact_factor_wos
    74 rdf:rest rdf:nil
    75 N3f014dfbceb442baa414ce2a996a0349 rdf:first impact_factor_wos
    76 rdf:rest rdf:nil
    77 N4920494fe7544d9da3e5b6c245d18ce9 schema:author N12fe8b4192fe42debb254d2045af3050
    78 schema:dateCreated 2007
    79 schema:ratingValue 0.238
    80 rdf:type schema:Rating
    81 N510c21437adb4216a1b8745484296bc7 schema:author Nf21c11dbfb1548af8dcad85137deb336
    82 schema:dateCreated 2015
    83 schema:ratingValue 0.361
    84 rdf:type schema:Rating
    85 N6c24c00c39194c7dacb720a7f53cddef schema:author N3f014dfbceb442baa414ce2a996a0349
    86 schema:dateCreated 2010
    87 schema:ratingValue 0.500
    88 rdf:type schema:Rating
    89 N6d388b58b1ff46efb19285504fb7ccea schema:name springer_id
    90 schema:value 10836
    91 rdf:type schema:PropertyValue
    92 N6e55162e7ee94ecbbe54d311ebdc020a rdf:first impact_factor_wos
    93 rdf:rest rdf:nil
    94 N807f9a940611475687a2d25bf9e54f42 rdf:first impact_factor_wos
    95 rdf:rest rdf:nil
    96 N83dd082146774ae1a27264f35e2faef8 schema:author N2b25e6d396db4d5280deb541da8e580f
    97 schema:ratingValue 0.191
    98 rdf:type schema:Rating
    99 N8845bbc395734c598a5532fc240e6790 schema:familyName Agrawal
    100 schema:givenName Vishwani
    101 rdf:type schema:Person
    102 N8a3befabf0ec4660b7f3483b2a2ec9c9 rdf:first impact_factor_wos
    103 rdf:rest rdf:nil
    104 N9440be0beeb6434fbc4941d93ca03b4e schema:name nsd_ids_id
    105 schema:value 442821
    106 rdf:type schema:PropertyValue
    107 N993e7005dffe448998b30694e52d28b7 schema:name Springer Nature - SN SciGraph project
    108 rdf:type schema:Organization
    109 N9957140dba9e457daaf5ef1607b35757 schema:author N6e55162e7ee94ecbbe54d311ebdc020a
    110 schema:dateCreated 2009
    111 schema:ratingValue 0.473
    112 rdf:type schema:Rating
    113 Nacf45bea96f742219bec7be54d2e147b rdf:first N8845bbc395734c598a5532fc240e6790
    114 rdf:rest rdf:nil
    115 Nad23456f04ac418397d7724c833b394f schema:author Nec947494d3e44a44bb144edf73082be9
    116 schema:dateCreated 2009
    117 schema:ratingValue 0.473
    118 rdf:type schema:Rating
    119 Naff027df7d6c403ba0ad2922cdf7218e rdf:first snip
    120 rdf:rest rdf:nil
    121 Nb4eafa703e5443dda3da808282e4367d rdf:first impact_factor_wos
    122 rdf:rest rdf:nil
    123 Nbf2b6fd520e74f31b3e31985093511be schema:author N8a3befabf0ec4660b7f3483b2a2ec9c9
    124 schema:dateCreated 2017
    125 schema:ratingValue 0.554
    126 rdf:type schema:Rating
    127 Nc340a45f5f3445ddbcd461fd0664859e schema:name Springer US
    128 rdf:type schema:Organization
    129 Ncfd1dd42bfcc4994bb5c3005e0f6d0bd rdf:first impact_factor_wos
    130 rdf:rest rdf:nil
    131 Ne050523e626e45c295869c486b34439f schema:author N36be478d54bd4257b1543b2615433b0b
    132 schema:dateCreated 2012
    133 schema:ratingValue 0.454
    134 rdf:type schema:Rating
    135 Ne35ff696d672444d9546c6ad19bdef93 rdf:first impact_factor_wos
    136 rdf:rest rdf:nil
    137 Ne84ca50aed14433396bc27e37487f874 schema:author Ncfd1dd42bfcc4994bb5c3005e0f6d0bd
    138 schema:dateCreated 2011
    139 schema:ratingValue 0.468
    140 rdf:type schema:Rating
    141 Nec947494d3e44a44bb144edf73082be9 rdf:first impact_factor_wos
    142 rdf:rest rdf:nil
    143 Nf1440821a6e34027b32f9ef1a27a73c9 schema:name scopus_id
    144 schema:value 18040
    145 rdf:type schema:PropertyValue
    146 Nf21c11dbfb1548af8dcad85137deb336 rdf:first impact_factor_wos
    147 rdf:rest rdf:nil
    148 sg:ontologies/product-market-codes/I23044 schema:inDefinedTermSet sg:ontologies/product-market-codes/
    149 schema:name Computer-Aided Engineering (CAD, CAE) and Design
    150 rdf:type schema:DefinedTerm
    151 sg:ontologies/product-market-codes/T24000 schema:inDefinedTermSet sg:ontologies/product-market-codes/
    152 schema:name Electrical Engineering
    153 rdf:type schema:DefinedTerm
    154 sg:ontologies/product-market-codes/T24068 schema:inDefinedTermSet sg:ontologies/product-market-codes/
    155 schema:name Circuits and Systems
    156 rdf:type schema:DefinedTerm
     




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